Measures beam quality factor M² and divergence angle
Minimum measurable divergence angle of 0.1 mrad; M² accuracy up to ±5%
One-click fully automatic measurement and analysis via the PC software, no manual alignment required
Complete measurement workflow with report output in less than 1 minute
USB 3.2 Type-C high-speed communication interface
Compatible with the Brolight BRM-642X series and DataRay WinCamD series beam profilers
Compact desktop design saves laboratory space
Beam quality and divergence measurement of solid-state lasers (e.g., Nd:YAG)
Beam quality analysis and factory testing of fiber lasers
Accurate divergence-angle measurement of semiconductor pump lasers
Beam quality research and teaching in academic and research optics laboratories
Quality inspection of high-end optical components
Item | Specification |
Wavelength Range | 350 nm – 1100 nm (depending on beam profiler) |
M² Measurement Scope | ≥1.0 |
M² Measurement Accuracy | ±5% |
Min. Beam Angle | 0.1 mrad |
Max. Operation Time | <1 min |
Focal Length | 300 mm |
Communication | USB 3.2 Type-C |
Power Supply | 24 VDC / 5 A |
Dimensions | 400 mm × 230 mm × 126 mm |
Weight | 5 kg |
