The BIX-8804 series is based on the spectral-reflectance interference principle. Broad-spectrum light reflects from the front and rear interfaces of the film, and the resulting interference spectrum is captured directly through a reflective optical fiber. Professional software algorithms then process the spectral signal to yield the thickness of the film under test. The result is high-precision, non-contact, non-destructive thickness measurement of transparent coatings and thin films, with a wide wavelength range and fast, simple operation.
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