Easy Sample Handling - Minimal fixture requirements for versatile sample placement
User-Friendly Operation - Simple protocols with excellent repeatability and rapid detection
Comprehensive Spectral Data - Full-spectrum reflectance values and curves for complete analysis
Advanced Color Measurement - Integrated sphere sampling for precise material color characterization
Specular Reflectance Measurement - For polished surfaces and mirror-like materials
Diffuse Reflectance Analysis - Ideal for rough/textured surfaces and coatings
Precision Color Characterization - Accurate color measurement of materials and finishes
| Model | BIX - 8811 - 0X1X (Model Note: 0X - Spectrometer option, 1X - Sample fixture option) |
| Spectrometer | 01: 200nm - 1100nm (BIM - 6002S - 22 - S03L02F06G13) |
| 02: 200nm - 900nm (BIM - 6002A - 01 - S03L02F06G01) | |
| 03: 400nm - 1100nm (BIM - 6002A - 13 - S03L01F05G02) | |
| Sample Fixture | 11: 1 to 1 fiber (SIM - 6102 - 1010 - S/S - P) *2ea Double - point Reflection Stage (BIM - 6303) *1ea |
| 12: Y type fiber (SIM - 6102Y - 061016 - T/SS+M) *1ea Double - point Reflection Stage (BIM - 6303) *1ea | |
| 13: Integrating Sphere for Reflection (SIM - 3003 - 02501) *1ea Integrating Sphere Stage (BIM - 6316 - 25) *1ea | |
| Light Source | Deuterium Tungsten Light Source (BIM - 6203) *1ea |
| Standard | Mirror Reflectance Standard (SIM - 6326 - 30) *1ea |
| Diffuse Reflectance Standard (SIM - 6304 - 30) *1ea |
