The SIX-8001 Infrared Radiation Measurement System is an active heat source detection benchtop infrared thermal imager that visually identifies thermal defects or overall temperature distribution for process monitoring. Its research applications including:
1. PCB Thermal Analysis – Circuit board heat distribution studies
2. Micro-component Inspection – Detection of micron-scale devices
3. Material Stress & Temperature Analysis – Thermal-mechanical behavior valuation
4. Thermal Performance Testing – Material property characterization
5. Chemical Reaction Temperature Analysis – Process thermal monitoring
6. Chemical Process Temperature Tracking – Industrial thermal supervision
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